System clock generating circuit for a semiconductor device

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Phase shift by less than period of input

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Details

327244, 327245, 327251, H03L 706, H03L 708, H03K 506

Patent

active

058015663

ABSTRACT:
According to the present invention, when a semiconductor device is tested, a signal for test can be set in the semiconductor device at a desired timing. A second delay circuit of the present invention has the same structure as a first delay circuit in a phase lock loop, and receives a control voltage from the phase lock loop so as to generate a clock signal with a frequency according to the control voltage and to delay and output the clock signal. A second pulse generator generates two-phase clocks by using delayed signals generated by the second delay circuit. Switches are used for switching between a system clock output terminal during an actually active time and a system clock output terminal during testing.

REFERENCES:
patent: 4494021 (1985-01-01), Bell et al.
patent: 5039893 (1991-08-01), Tomisawa
patent: 5081428 (1992-01-01), Atriss et al.
patent: 5146121 (1992-09-01), Searles et al.
patent: 5428309 (1995-06-01), Yamauchi et al.
patent: 5475344 (1995-12-01), Manealtis et al.
patent: 5638019 (1997-06-01), Frankeny

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