Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1998-07-31
2000-08-29
Metjahic, Safet
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324652, G01B 714
Patent
active
061114146
ABSTRACT:
A system for testing interconnects in multi-chip modules including a radio frequency resonator having a resonant circuit with a relatively high quality factor, the output of the resonant circuit being attached to a probe. Electrically coupled to the resonant circuit output is an apparatus to analyze the voltage signal output. The probe is applied to one end of an interconnect. When the probe is applied, the resonant frequency of the resonant circuit and the magnitude of the frequency response are altered due to the additional loading created by the interconnect. Due to the relatively high quality factor of the resonant circuit, the magnitude of the frequency response of the altered resonant circuit is measurably distinct from a predetermined reference magnitude at a predetermined reference frequency, thus indicating the existence of a defect. Additionally, the type of defect that exists is ascertainable by determining whether the resonant frequency of the altered resonant circuit is greater or less than the reference frequency by examining, for example, the phase response.
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Chatterjee Abijit
Kim Bruce
Swaminathan Madhavan
Georgia Tech Research Corporation
Metjahic Safet
Nguyen Vincent Q.
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