Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-04-29
2008-04-29
Turner, Archene (Department: 1775)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S479000, C356S482000, C356S497000, C356S504000
Reexamination Certificate
active
07365860
ABSTRACT:
A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.
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PCT Search Report Issued by the European Patent Office for PCT/US2005/047585 mailed Jul. 25, 2006.
Kilpatrick & Stockton LLP
Sensory Analytics
Turner Archene
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