System, apparatus and/or method for analyzing light intensities

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections

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25055945, 356431, G01N 2189

Patent

active

054614813

ABSTRACT:
A system, apparatus and/or method for detecting and analyzing light intensities of reflected light from a surface of /a specimen, preferably a web, wherein light is directed onto the surface of the specimen, light reflected from the surface is detected by an array of photosensitive elements, and a signal generated by the array is analyzed to identify reflected light intensities that exceed at least one threshold for a sufficient number of photosensitive elements to warrant classification as indicative of a sufficiently pronounced change in the angularity or reflectance in the surface of the specimen. In particular, the pronounced change can be identified as a defect, for example, a crease, in the specimen surface. Preferably, the array is a CCD array. Preferably, the specimen is a video tape.

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patent: 4687943 (1987-08-01), Bowen et al.
patent: 4786177 (1988-11-01), Beckstein et al.
patent: 4900942 (1990-02-01), Rumler
patent: 5130555 (1992-07-01), Suzuki et al.

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