Image analysis – Applications – Surface texture or roughness measuring
Reexamination Certificate
2003-05-21
2008-10-21
Bhatnagar, Anand (Department: 2624)
Image analysis
Applications
Surface texture or roughness measuring
C353S034000, C352S047000, C359S263000, C345S582000
Reexamination Certificate
active
07440590
ABSTRACT:
A technique, associated system and program code, for retrieving depth information about at least one surface of an object. Core features include: projecting a composite image comprising a plurality of modulated structured light patterns, at the object; capturing an image reflected from the surface; and recovering pattern information from the reflected image, for each of the modulated structured light patterns. Pattern information is preferably recovered for each modulated structured light pattern used to create the composite, by performing a demodulation of the reflected image. Reconstruction of the surface can be accomplished by using depth information from the recovered patterns to produce a depth map/mapping thereof. Each signal waveform used for the modulation of a respective structured light pattern, is distinct from each of the other signal waveforms used for the modulation of other structured light patterns of a composite image; these signal waveforms may be selected from suitable types in any combination of distinct signal waveforms, provided the waveforms used are uncorrelated with respect to each other. The depth map/mapping to be utilized in a host of applications, for example: displaying a 3-D view of the object; virtual reality user-interaction interface with a computerized device; face—or other animal feature or inanimate object—recognition and comparison techniques for security or identification purposes; and 3-D video teleconferencing/telecollaboration.
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Guan Chun
Hassebrook Laurence G.
Lau Daniel L.
Bhatnagar Anand
Macheledt Bales & Heidmiller LLP
University of Kentucky Research Foundation
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