System and software for database structure in semiconductor...

Data processing: database and file management or data structures – Database design – Data structure types

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C707S793000, C707S793000, C707S793000

Reexamination Certificate

active

06839713

ABSTRACT:
The functionality of various process control and data collection system embodiments may be improved by employing the database methodology disclosed herein during the requirements-analysis phase for data collection and process control in a semiconductor manufacturing environment. The relational database storage technology as disclosed herein consists of a set of interconnected tables, where each table has a field or an amalgamation of fields (primary key) that uniquely identifies each record (tuple) in the table. In addition, the method as disclosed herein utilizes foreign keys, which represent the value of a primary key for a related table. Aggregation levels are also employed in the method as disclosed herein to associate data from various production

REFERENCES:
patent: 4590550 (1986-05-01), Eilert et al.
patent: 4967381 (1990-10-01), Lane et al.
patent: 5196997 (1993-03-01), Kurtzberg et al.
patent: 5586041 (1996-12-01), Mangrulkar
patent: 5646870 (1997-07-01), Krivokapic et al.
patent: 5654903 (1997-08-01), Reitman et al.
patent: 5715181 (1998-02-01), Horst
patent: 5719495 (1998-02-01), Moslehi
patent: 5761064 (1998-06-01), La et al.
patent: 5790977 (1998-08-01), Ezekiel
patent: 5841676 (1998-11-01), Ali et al.
patent: 5883437 (1999-03-01), Maruyama et al.
patent: 5930138 (1999-07-01), Lin et al.
patent: 5964643 (1999-10-01), Birang et al.
patent: 5978071 (1999-11-01), Miyajima et al.
patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 5995912 (1999-11-01), DeWolf et al.
patent: 6027842 (2000-02-01), Ausschnitt et al.
patent: 6055463 (2000-04-01), Cheong et al.
patent: 6163801 (2000-12-01), O'Donnell et al.
patent: 6240329 (2001-05-01), Sun
patent: 6303395 (2001-10-01), Nulman
patent: 6370448 (2002-04-01), Eryurek
patent: 6370487 (2002-04-01), Dorough
patent: 6424876 (2002-07-01), Cusson et al.
patent: 6430565 (2002-08-01), Berger et al.
patent: 6442445 (2002-08-01), Bunkofske et al.
patent: 6442560 (2002-08-01), Berger et al.
patent: 6445969 (2002-09-01), Kenney et al.
patent: 6446059 (2002-09-01), Berger et al.
patent: 6470227 (2002-10-01), Rangachari et al.
patent: 6487472 (2002-11-01), Song et al.
patent: 6499007 (2002-12-01), Kuroki et al.
patent: 6528219 (2003-03-01), Conrad et al.
patent: 6532427 (2003-03-01), Joshi et al.
patent: 6587744 (2003-07-01), Stoddard et al.
patent: 20020078018 (2002-06-01), Tse et al.
patent: 20020116083 (2002-08-01), Schulze
patent: 20030028509 (2003-02-01), Sah et al.
patent: 20030109951 (2003-06-01), Hsiung et al.
SECSHost: Expand Your View with SECS Communications, Oct. 20, 1999.
SPC: Expand Your View with Statistical Process Control, Mar. 15, 2000.
RSView32: Technical Data, May 15, 2000.
RSView Machine Edition: Technical Data, Nov. 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and software for database structure in semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and software for database structure in semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and software for database structure in semiconductor... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3399034

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.