X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1995-06-02
1998-12-29
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Absorption
378210, G01N 2306
Patent
active
058548211
ABSTRACT:
A system and process are provided for determining the concentration of a first component of a mixture wherein the first component includes at least 3 materials. The process includes directing 2 beams of x-rays into the mixture and receiving portions of the beams which are transmitted through the mixture. The concentration of the first component is determined based upon the beams transmitted through the mixture.
REFERENCES:
patent: Re30884 (1982-03-01), Buchnea
patent: 2445305 (1948-07-01), Hochgesang
patent: 2861188 (1958-11-01), Dijkstra
patent: 2983819 (1961-05-01), Bigelow et al.
patent: 3030512 (1962-04-01), Harker
patent: 3100261 (1963-08-01), Bigelow
patent: 3114832 (1963-12-01), Alvarez
patent: 3121166 (1964-02-01), Vossberg
patent: 3270204 (1966-08-01), Rhodes
patent: 3287560 (1966-11-01), Morgan
patent: 3366790 (1968-01-01), Zagorites et al.
patent: 3402292 (1968-09-01), Baecklund
patent: 3412249 (1968-11-01), Hanken
patent: 3417244 (1968-12-01), Kramer
patent: 3435220 (1969-03-01), Hanken
patent: 3452192 (1969-06-01), Hanken
patent: 3525863 (1970-08-01), Constantine et al.
patent: 3530296 (1970-09-01), Lehtinen et al.
patent: 3581087 (1971-05-01), Brinkerhoff et al.
patent: 3701899 (1972-10-01), Voparil
patent: 3843884 (1974-10-01), Evans
patent: 3904876 (1975-09-01), Arendt
patent: 4081676 (1978-03-01), Buchnea
patent: 4090074 (1978-05-01), Watt et al.
patent: 4168431 (1979-09-01), Henriksen
patent: 4363968 (1982-12-01), McGowan et al.
patent: 4815116 (1989-03-01), Cho
Alexander Buchnea, Lawrence A. McNelles and John S. Hewitt, The Application of X-Ray Absorption and Fluorescence Analysis to the Measurement of Paper Additives, Int.J.Appl.Radiat.Isot. vol. 33, pp. 285 to 292 (1982).
Nils C. Fernelius, Richard J. Harris, David B. O'Quinn, Michael E. Gangl and David V. Dempsey, Some optical properties of materials measured at 1.3 .mu.m, 2417 Optical Engineering, vol. 22, pp. 411-418 (1983).
Abstracts of Papers to be Presented at the ERDA Symposium on X-and Gamma-Ray Sources and Applications, May 19-21, 1976, Ann Arbor, Michigan, pp. 6,7,37.
Paul Kirkpatrick, On the Theory and Use of Ross Filters, Review of Scientific Instruments, pp. 186-191 (Jun., 1939).
"A New Tio.sub.2 Compensated X-Ray Ash Sensor for Paper", by B. Y. Cho and O. L. Utt, Industrial Nucleonics, Columbus, Ohio, 1975.
"Composition Compensated Paper Ash Gauge", by Orval I. Utt and Hoong Y. Cho, Industrial Nucleonics Corporation, Columbus, Ohio, 1975.
"Composition Compensated Paper Ash Guage," Utt et al, Industrial Nucleonics Corp. Columbus, OH 1975.
Chase Lee
Goss John
Hegland Philip
Church Craig E.
Honeywell-Measurex Corporation
LandOfFree
System and process for measuring ash in paper does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and process for measuring ash in paper, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and process for measuring ash in paper will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1429021