System and process for inspecting and repairing an original

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 43, G21K 700

Patent

active

058083120

ABSTRACT:
An original inspecting and repairing system includes an inspecting device having at least one of a vacuum ultraviolet ray microscope and an X-ray microscope, for inspecting an original, and a processing device for processing the original on the basis of the inspection. This practically enables inspection and repair of any fault of a reflection type original.

REFERENCES:
patent: 4548883 (1985-10-01), Wagner
patent: 5123036 (1992-06-01), Uno et al.
patent: 5177774 (1993-01-01), Suckewer et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and process for inspecting and repairing an original does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and process for inspecting and repairing an original, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and process for inspecting and repairing an original will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-91080

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.