System and methods to determine and monitor changes in...

Details System and methods to determine and monitor changes in... System and methods to determine and monitor changes in...

2011-05-17

2011-05-17

Williams, Hezron (Department: 2856)

Measuring and testing

Vibration

By mechanical waves

C073S636000

Reexamination Certificate

active

07942058

ABSTRACT:
A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.

REFERENCES:
patent: 4010636 (1977-03-01), Clark et al.
patent: 4283953 (1981-08-01), Plona
patent: 4435984 (1984-03-01), Gruber
patent: 5020371 (1991-06-01), Panetti
patent: 5335184 (1994-08-01), Hildebrand
patent: 5341683 (1994-08-01), Searle
patent: 5386727 (1995-02-01), Searle
patent: 5390544 (1995-02-01), Madras
patent: 5721685 (1998-02-01), Holland et al.
patent: 6044698 (2000-04-01), Bryan
patent: 6742392 (2004-06-01), Gilmore et al.
patent: 7403296 (2008-07-01), Farritor et al.
patent: 7755774 (2010-07-01), Farritor et al.
patent: 2004/0003662 (2004-01-01), Kenderian et al.
patent: 2005/0072236 (2005-04-01), Heyman et al.
patent: 2006/0136152 (2006-06-01), Takahashi
patent: 2008/0228436 (2008-09-01), Farritor
patent: 2009/0070064 (2009-03-01), Farritor et al.
patent: 7174643 (1995-07-01), None
patent: 1801844 (1993-03-01), None
Definition of Standard Deviation, downloaded May 19, 2009, from http://mathworld.wolfram.com/, pp. 1-4.

Affiliated with

Also associated with

Rating

System and methods to determine and monitor changes in... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and methods to determine and monitor changes in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and methods to determine and monitor changes in... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2688842