System and method using locally heated island for integrated...

Details System and method using locally heated island for integrated... System and method using locally heated island for integrated...

2007-01-30

2007-01-30

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

10936164

ABSTRACT:
A test system and method for integrated circuits includes an energy source having an adjustable energy rate, and a feedback device, which measures a physical quantity at a discrete position on an integrated circuit. A control circuit adjusts the power source to externally apply energy to the integrated circuit at the discrete position. A circuit tester applies test programs to the integrated circuit while the discrete position is maintained at a value of the physical quantity in accordance with the control circuit.

REFERENCES:
patent: 6181143 (2001-01-01), Ghoshal
patent: 6455336 (2002-09-01), Berndlmaier et al.
patent: 6980016 (2005-12-01), Pullen et al.
Edward I. Cola, Jr., et al, Backside Localization of Open and Shorted IC Interconnections, 36th Annual Int'l Reliability PHysicis Symposium, Reno Nevada, 1998, pp. 129-136.

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