System and method to use dynamic feedback of analog to...

Details System and method to use dynamic feedback of analog to... System and method to use dynamic feedback of analog to...

2007-08-21

2007-08-21

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Plural inputs

C324S076110, C324S141000

Reexamination Certificate

active

11165726

ABSTRACT:
A system and method for dynamically lock the sample rate of an analog to digital (ADC) converter to an input frequency. Specifically, a system for measuring power is disclosed. The system includes an ADC converter, a measuring module, an ADC cycle counter, and a calculation block coupled together. The ADC converter samples an analog input line signal. The measuring module measures a predetermined number of line cycles of the analog input line signal. The ADC cycle counter measures an actual sample count of the analog input line signal by the ADC converter over the predetermined number of line cycles. The calculation block determines an error rate between the actual sample count and an ideal sample count that is based on a predetermined over sample rate.

REFERENCES:
patent: 5514958 (1996-05-01), Germer
patent: 6662124 (2003-12-01), Schweitzer et al.
patent: 6845333 (2005-01-01), Anderson et al.
patent: 2002/0013668 (2002-01-01), Maruyama
patent: 2003/0042886 (2003-03-01), Gandhi
patent: 2003/0197632 (2003-10-01), Rubin et al.
patent: 2004/0190211 (2004-09-01), Ockert et al.

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