Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2006-01-31
2006-01-31
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Pattern recognition
Feature extraction
C382S215000, C382S219000, C382S220000, C382S251000, C707S793000
Reexamination Certificate
active
06993189
ABSTRACT:
A system and method to facilitate pattern recognition or matching between patterns are disclosed that is substantially invariant to small transformations. A substantially smooth deformation field is applied to a derivative of a first pattern and a resulting deformation component is added to the first pattern to derive a first deformed pattern. An indication of similarity between the first pattern and a second pattern may be determined by minimizing the distance between the first deformed pattern and the second pattern with respect to deformation coefficients associated with each deformed pattern. The foregoing minimization provides a system (e.g., linear) that may be solved with standard methods.
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Jojic Nebojsa
Simard Patrice
Amin & Turocy LLP
Desire Gregory
Mehta Bhavesh M.
Microsoft Corporation
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