Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2011-06-28
2011-06-28
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S496000
Reexamination Certificate
active
07969583
ABSTRACT:
A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The probe system is further configured to compute a ripple metric value associated with each of a plurality of possible z values, where z is an object distance. The probe system is also configured to determine an approximated z value using the computed ripple metric values. A method for determining an object distance z is also provided.
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Bendall Clark Alexander
Harding Kevin George
Song Guiju
Tao Li
Conkin Mark A.
Connolly Patrick J
General Electric Company
Global Patent Operation
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