System and method to determine an object distance from a...

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis

Reexamination Certificate

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C356S496000

Reexamination Certificate

active

07969583

ABSTRACT:
A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The probe system is further configured to compute a ripple metric value associated with each of a plurality of possible z values, where z is an object distance. The probe system is also configured to determine an approximated z value using the computed ripple metric values. A method for determining an object distance z is also provided.

REFERENCES:
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Albert Boehnlein and Kevin Harding, “Field Shift Moire, a New Technique for Absolute Range Measurement”, SPIE conference 1163, Fringe Analysis Methods, San Diego, Aug. 1989.
Leonard H. Bieman and Kevin G. Harding, “Absolute Measurement using Field Shifted Moire”, SPIE Proceedings vol. 1614, Optics, Illumination and Image Sensing for Machine Vision VI, Boston, Nov. 1991.
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Kevin Harding, “Latest optical methods for industrial dimensional metrology,”, Proc. SPIE vol. 6000, 600001, Two- and Three-Dimensional Methods for Inspection and Metrology III; Ed. (2005).

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