Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2004-12-21
2009-08-18
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C356S614000
Reexamination Certificate
active
07576848
ABSTRACT:
The present invention provides a compact optical probe assembly that measures ultrasound in materials. The probe uses angle-terminated optical fiber to direct illumination laser light at the surface of a remote target. Ultrasonic displacements at the surface scatter the illumination laser light. Angle-terminated optical fibers collect phase modulated light and direct the phase modulated light to an optical processor to produce a signal representative of the ultrasonic surface displacements. The probe may also incorporate angle-terminated optical fibers to direct generation laser light to the surface of a remote target to generate ultrasonic surface displacements. Optional shared beam forming element(s) may optically act on the illumination laser and collected phase modulated light.
REFERENCES:
patent: 4581939 (1986-04-01), Takahashi
patent: 4659224 (1987-04-01), Monchalin
patent: 6609425 (2003-08-01), Ogawa
patent: 6657733 (2003-12-01), Drake, Jr.
patent: 2005/0023434 (2005-02-01), Yacoubian
patent: 2006/0215174 (2006-09-01), Dubois et al.
Drake, Jr. Thomas E.
Dubois Marc
Fomitchov Pavel
Bracewell & Giuliani LLP
Lockheed Martin Corporation
Punnoose Roy M
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