System and method to avoid voltage read errors in open digit...

Static information storage and retrieval – Format or disposition of elements

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S063000, C365S230030

Reexamination Certificate

active

06856530

ABSTRACT:
Selective coupling devices directed by coupling controllers prevent cell plate and/or substrate disturbances from causing memory cell read and refresh errors in open digit line array memory devices. Using selective decoupling devices, when memory cells in an active row store an appreciably unbalanced number of either zeroes or ones, reading the cells generates a voltage transient in the cell plate and/or substrate that can be coupled to a reference digit line because the cell plates and/or substrates of the active sub-array are normally coupled to the cell plates and/or substrates of the reference arrays. By decoupling the cell plate and/or substrate of the active sub-array from the cell plates and/or substrates of the reference arrays, any coupling of the voltage transients to reference digit lines is reduced.

REFERENCES:
patent: 5608668 (1997-03-01), Zagar
patent: 5844833 (1998-12-01), Zagar et al.
patent: 5926410 (1999-07-01), Raad et al.
patent: 6043562 (2000-03-01), Keeth
patent: 6515925 (2003-02-01), Graham et al.
patent: 6535439 (2003-03-01), Cowles
patent: 6549476 (2003-04-01), Pinney
patent: 6566206 (2003-05-01), Clampitt

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method to avoid voltage read errors in open digit... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method to avoid voltage read errors in open digit..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method to avoid voltage read errors in open digit... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3509724

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.