Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate
2006-06-20
2006-06-20
Ahmed, Samir (Department: 2623)
Image analysis
Applications
3-d or stereo imaging analysis
C382S285000, C345S420000
Reexamination Certificate
active
07065242
ABSTRACT:
System and method for constructing a 3D model of an object based on a series of silhouette and texture map images. In the exemplary embodiment an object is placed on a rotating turntable and a camera, which is stationary, captures images of the object as it rotates on the turntable. In one pass, the system captures a number of photographic images that will be processed into image silhouettes. In a second pass, the system gathers texture data. After a calibration procedure (used to determine the camera's focal length and the turntable's axis of rotation), a silhouette processing module determines a set of two-dimensional polygon shapes (silhouette contour polygons) that describe the contours of the object. The system uses the silhouette contour polygons to create a 3D polygonal mesh model of the object. The system determines the shape of the 3D model analytically-by finding the areas of intersection between the edges of the model faces and the edges of the silhouette contour polygons. The system creates an initial, (rough) model of the 3D object from one of the silhouette contour polygons, then executes an overlaying procedure to process each of the remaining silhouette contour polygons. In the overlaying process, the system processes the silhouette contour polygons collected from each silhouette image, projecting each face of the (rough) 3D model onto the image plane of the silhouette contour polygons. The overlaying of each face of the (rough) 3D model onto the 2D plane of the silhouette contour polygons enables the present invention to determine those areas that are extraneous and should be removed from the (rough) 3D model. As the system processes the silhouette contour polygons in each image it removes the extraneous spaces from the initial object model and creates new faces to patch “holes.” The polygonal mesh model, once completed, can be transformed into a triangulated mesh model. In a subsequent step, the system uses a deterministic procedure to map texture from the texture images onto the triangles of the 3D mesh model, locating that area in the various texture map images that is “best” for each mesh triangle.
REFERENCES:
patent: 4175862 (1979-11-01), DiMatteo et al.
patent: 4238147 (1980-12-01), Stern
patent: 4297034 (1981-10-01), Ito et al.
patent: 4529305 (1985-07-01), Welford et al.
patent: 4529316 (1985-07-01), DiMatteo
patent: 4575805 (1986-03-01), Moermann et al.
patent: 4627734 (1986-12-01), Rioux
patent: 4645347 (1987-02-01), Rioux
patent: 4653104 (1987-03-01), Tamura
patent: 4705401 (1987-11-01), Addleman et al.
patent: 4737032 (1988-04-01), Addleman et al.
patent: 4794262 (1988-12-01), Sato et al.
patent: 4800270 (1989-01-01), Blais
patent: 4800271 (1989-01-01), Blais
patent: 4819197 (1989-04-01), Blais
patent: 4825263 (1989-04-01), Desjardins et al.
patent: 4871256 (1989-10-01), Grindon
patent: 4948258 (1990-08-01), Caimi
patent: 4952149 (1990-08-01), Duret et al.
patent: 4961155 (1990-10-01), Ozeki et al.
patent: 4965665 (1990-10-01), Amir
patent: 4982102 (1991-01-01), Inoue et al.
patent: 4982438 (1991-01-01), Usami et al.
patent: 5018854 (1991-05-01), Rioux
patent: 5027281 (1991-06-01), Rekow et al.
patent: 5030008 (1991-07-01), Scott et al.
patent: 5102223 (1992-04-01), Uesugi et al.
patent: 5102224 (1992-04-01), Uesugi et al.
patent: 5104227 (1992-04-01), Uesugi et al.
patent: 5127061 (1992-06-01), Amir et al.
patent: 5164793 (1992-11-01), Wolfersberger et al.
patent: 5170439 (1992-12-01), Zeng et al.
patent: 5177556 (1993-01-01), Rioux
patent: 5187364 (1993-02-01), Blais
patent: 5193120 (1993-03-01), Gamache et al.
patent: 5196900 (1993-03-01), Pettersen
patent: 5216236 (1993-06-01), Blais
patent: 5218427 (1993-06-01), Koch
patent: 5259037 (1993-11-01), Plunk
patent: 5270795 (1993-12-01), Blais
patent: 5280542 (1994-01-01), Ozeki et al.
patent: 5303386 (1994-04-01), Fiasconaro
patent: 5305092 (1994-04-01), Mimura et al.
patent: 5321766 (1994-06-01), Fraas et al.
patent: 5345490 (1994-09-01), Finnigan et al.
patent: 5377011 (1994-12-01), Koch
patent: 5381236 (1995-01-01), Morgan
patent: 5381526 (1995-01-01), Ellson
patent: 5410358 (1995-04-01), Shackleton et al.
patent: 5416591 (1995-05-01), Yoshimura et al.
patent: 5418608 (1995-05-01), Caimi et al.
patent: 5424835 (1995-06-01), Cosnard et al.
patent: 5436655 (1995-07-01), Hiyama et al.
patent: 5444537 (1995-08-01), Yoshimura et al.
patent: 5446548 (1995-08-01), Gerig et al.
patent: 5446549 (1995-08-01), Mazumder et al.
patent: 5465323 (1995-11-01), Mallet
patent: 5473436 (1995-12-01), Fukazawa
patent: 5481483 (1996-01-01), Ebenstein
patent: 5489950 (1996-02-01), Masuda
patent: 5506683 (1996-04-01), Yang et al.
patent: 5509090 (1996-04-01), Maruyama et al.
patent: 5511153 (1996-04-01), Azarbayejani et al.
patent: 5513276 (1996-04-01), Theodoracatos
patent: 5528737 (1996-06-01), Sfarti
patent: 5528738 (1996-06-01), Sfarti et al.
patent: 5589942 (1996-12-01), Gordon
patent: 5615003 (1997-03-01), Hermary et al.
patent: 5619587 (1997-04-01), Willoughby, Jr. et al.
patent: 5671395 (1997-09-01), Kiyama
patent: 5680216 (1997-10-01), Hierholzer et al.
patent: 5699444 (1997-12-01), Palm
patent: 5784098 (1998-07-01), Shoji et al.
patent: 6044170 (2000-03-01), Migdal et al.
patent: 1295039 (1992-01-01), None
patent: 1332633 (1994-10-01), None
patent: 0 632 349 (1995-01-01), None
patent: 2264601 (1993-09-01), None
patent: 2264602 (1993-09-01), None
patent: 4-110707 (1992-04-01), None
patent: WO 96/06325 (1996-02-01), None
Hoppe, Hugues, “Surface Reconstruction from Unorganized Points”, Dissertation UW, pp. 1-116, 1994.
Eck, Matthias, et al., “Multiresolution Analysis of Arbitrary Meshes”, Technical Report #95 01-02, pp. 1-25, 1995.
DeRose, Tony, et al., “Fitting of Surfaces to Scattered Data”, University of Washington, pp. 212-220.
Hoppe, Hugues, “Generation of 3D Geometric Models from Unstructed 3D Points”, pp. 424-431.
Turk, Greg, et al., “Zippered Polygon Meshes from Range Images”, Stanford University, 8 pages.
Rioux, Marc, et al., “White Laser, Synced Scan”, IEEE computer Graphics and Applications, vol. 13, No. 3, pp. 15-17, May 1995.
Carlborn, Ingrid, et al., “Modeling and Analysis of Empirical Data in Collaborative Environments”, Commnunications of the ACM, vol. 35, No. 6, Jun. 1992, p. 1-13.
Jones, P.F., et al., “Comparison of Three Three-Dimensional Imaging Systems”, J. Opt. Soc. Am. A., vol. 11, No. 10, Oct. 1994, pp. 2613-2621.
Hausler, Gerd, et al., “Light Sectioning With Large Depth and High Resolution”, Applied Optics, vol. 27, No. 24, Dec. 15, 1988, pp. 5165-5169.
Motamedi, M. Edward, et al., “Miniaturized Micro-Optical Scanners”, Optical Engineering, vol. 33, No. 11, Nov. 1994, pp. 3616-3623.
Rioux, Marc, et al., “Design of a Large Depth of View Three-Dimensional Camera for Robot Vision”, Optical Engineering, vol. 26, No. 12, Dec. 1987, pp. 1245-1250.
Trepte, Oliver, et al., “Computer Control for a Galvanometer Scanner in a Confocal Scanning Laser Microscope”, Optical Engineering, vol. 33, No. 11, Nov. 1994, pp. 3774-3780.
Strand, T.C., “Optical Three-Dimensional Sensing for Machine Vision”, Optical Engineering, vol.24, No. 1., Jan./Feb. 1985, pp. 33-40.
Busch, David D., “Getting the Picture”, Windows Sources, Nov. 1995, pp. 114-136.
Marshall, G.F., “Scanner Refinements Inspire New Uses”, Laser Focus World, June 1994, pp. 2-6.
Ludwiszewski, Alan, “Standards for Oscillatory Scanners”, General Scanning Inc., Feb. 1993, pp. 1-21.
“Cyberware Corporate Backgrounder”, Cyberware WWW Support (Internet Site), Jan. 16, 1996 (last update, 11 pages.
Brosens, Pierre J., “Scanning Speed and Accuracy of Moving Magnet Optical Scanners” Optical Engineering, vol. 34, No. 1, Jan. 1995, pp. 200-207.
Abadjev Vadim
Lebedev Alexei
Migdal Alexander
Petrov Michael
Polonskiy Leonid
Ahmed Samir
Kenyon & Kenyon LLP
Kim Charles
Viewpoint Corporation
LandOfFree
System and method of three-dimensional image capture and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method of three-dimensional image capture and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method of three-dimensional image capture and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3637784