System and method of processing a data signal

Details System and method of processing a data signal System and method of processing a data signal

2005-08-30

2005-08-30

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S079000, C702S189000, C375S226000

Reexamination Certificate

active

06937949

ABSTRACT:
Systems and methods for testing bit processing capacities of electronic devices and for reducing or eliminating jitter that compromises the ability of electronic devices to perform this task. Embodiments include circuitry and a methodology for locating and employing a data signal delay—in conjunction with a latch—to reduce or eliminate jitter from serial encoded data generated by a serializer/deserializer. The data signal delay ensures that the latch latches a state of the serial encoded data at a position within a data signal cycle of minimum jitter.

REFERENCES:
patent: 5268949 (1993-12-01), Watanabe et al.
patent: 5748672 (1998-05-01), Smith et al.
patent: 5761216 (1998-06-01), Sotome et al.
patent: 6661836 (2003-12-01), Dalal et al.
patent: 6694462 (2004-02-01), Reiss et al.

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