System and method of monitoring, predicting and optimizing...

Details System and method of monitoring, predicting and optimizing... System and method of monitoring, predicting and optimizing...

2006-02-07

2006-02-07

Pert, Evan (Department: 2826)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C324S701000, C702S001000

Reexamination Certificate

active

06996446

ABSTRACT:
A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, and optimizing production yields is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user-defined parameters, such as profit.

REFERENCES:
patent: 5170127 (1992-12-01), Henley
patent: 5406213 (1995-04-01), Henley
patent: 5432461 (1995-07-01), Henley
patent: 5465052 (1995-11-01), Henley
patent: 5774100 (1998-06-01), Aoki et al.
patent: 5986724 (1999-11-01), Akiyama et al.

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