Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Methods of use
Reexamination Certificate
2007-07-27
2009-06-30
Stultz, Jessica T (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Methods of use
C351S221000, C351S212000, C351S216000
Reexamination Certificate
active
07553022
ABSTRACT:
A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.
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Copland Richard James
Neal Daniel R.
Neal David A.
AMO Wavefront Sciences LLC
Stultz Jessica T
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