Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-03-28
2006-03-28
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S068000, C702S176000, C375S259000, C375S346000, C375S354000, C375S355000, C375S350000, C714S781000
Reexamination Certificate
active
07020567
ABSTRACT:
The present invention relates generally to an improvement in the ability of test systems to test bit processing capacities of electronic devices, and in particular an improvement in their ability to measure a signal propagation delay through an object connected to an optoelectronic device. The present invention includes determining for how long after a specific bit or bit group is transmitted by an optical transceiver the bit or bit group is received at the other end of the object connected to the optical transceiver.
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Bannikov Dmitri
Dorofeev Serguei
Fennelly Robert Lee
Fishman Alex
Nagarajan Subra
Finisar Corporation
Tsai Carol S. W.
Workman Nydegger
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