Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-12-18
2007-12-18
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S127000, C702S188000, C710S100000, C710S305000, C710S306000, C710S314000, C717S124000, C717S107000, C717S149000, C717S106000, C700S245000
Reexamination Certificate
active
11052038
ABSTRACT:
A system and method of measurement and processing of physical variables, and in particular electrical variables, comprising: a multimeter to measure multiple electrical variables, similar to any conventional multimeter; a microcomputer capable of the numerical processing of variables, storage and communication; a conventional computer that can read magnetic or optical storage media, or alternately, be connected to the Internet; an Internet website of public access to users of said multimeter; an Internet server which runs mathematical processing software to carry out graphical and numerical analysis.
REFERENCES:
patent: 6556003 (2003-04-01), Choi
patent: 6823283 (2004-11-01), Steger et al.
Banner & Witcoff , Ltd.
Barlow Jr. John E.
Conecta S.A.
Kundu Sujoy
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