Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-11-06
2007-11-06
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S074000, C702S191000
Reexamination Certificate
active
11453282
ABSTRACT:
A system and method of estimating random and periodic phase noise components based on measurement of phase jitter in a given signal uses a difference filter to attenuate low frequency random noise components and a process of obtaining timing measurements at a plurality of sampling frequencies in order to de-alias identified noise spurs. Such technology is especially well-suited for devices capable of undersampling a jitter signal, such as continuous time interval analyzers (CTIAs).
REFERENCES:
patent: 6185509 (2001-02-01), Wilstrup et al.
patent: 6356850 (2002-03-01), Wilstrup et al.
Bui Bryan
Guide Technology, Inc.
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