Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-08-11
2010-02-09
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07659740
ABSTRACT:
Digital testing of an analog driver circuit is enabled using a circuit including a control circuit for generating signals, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit, and a differential receiver circuit for converting the differential output signal to a single ended signal and transmitting the single ended signal. The testing includes skewing a differential output termination impedance, adjusting a differential receiver circuit voltage offset, selecting a differential driver circuit power level, enabling a decoder which activates only one differential driver circuit segment per test sequence, activating a segment, stimulating the differential driver circuit with digital test patterns, receiving differential driver circuit output, converting the output to a single-ended signal, and observing the single-ended signal.
REFERENCES:
patent: 4298980 (1981-11-01), Hajdu et al.
patent: 5107208 (1992-04-01), Lee
patent: 5481471 (1996-01-01), Naglestad et al.
patent: 5610530 (1997-03-01), Whetsel
patent: 5657456 (1997-08-01), Gist et al.
patent: 5861774 (1999-01-01), Blumenthal
patent: 6011387 (2000-01-01), Lee
patent: 6185710 (2001-02-01), Barnhart
patent: 6535945 (2003-03-01), Tobin et al.
patent: 6609221 (2003-08-01), Coyle et al.
patent: 6680681 (2004-01-01), Hsu et al.
patent: 6694462 (2004-02-01), Reiss et al.
Digital Systems Testing and Testable Design, IEEE Press, Ch. 9.3-9.9, 1990.
‘Bist for D/A and A/D Converters’, IEEE Design & Test of Computers v. 13 n. 4 Winter 1996, pp. 40-49.
U.S. Appl. No. 10/604,025, Data Transceiver and Method for Equalizing the Data Eye of a Differential Input Data Signal, Camara, et al.
Baecher Matthew B.
Bardsley Thomas J.
Hwang Charlie C.
Marsh Joseph O.
Mason James S.
International Business Machines - Corporation
MacKinnon Ian D.
Nguyen Ha Tran T
Velez Roberto
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