X-ray or gamma ray systems or devices – Source
Reexamination Certificate
2006-03-21
2006-03-21
Church, Craig E. (Department: 2882)
X-ray or gamma ray systems or devices
Source
C378S001000, C378S122000, C372S094000, C372S070000
Reexamination Certificate
active
07016470
ABSTRACT:
The invention provides a system for generating X-rays via the process of inverse Compton scattering. The system includes a high repetition rate laser adapted to direct high-energy optical pulses in a first direction in a laser cavity and a source of pulsed electron beam adapted to direct electron beam in a second direction opposite to the first direction in the laser cavity. The electron beam interacts with photons in the optical pulses in the laser cavity to produce X-rays in the second direction.
REFERENCES:
patent: 4598415 (1986-07-01), Luccio et al.
patent: 5247562 (1993-09-01), Steinbach
patent: 5353291 (1994-10-01), Sprangle et al.
patent: 6035015 (2000-03-01), Ruth et al.
patent: 6332017 (2001-12-01), Carroll et al.
patent: 6459766 (2002-10-01), Srinivasan-Rao
patent: 6724782 (2004-04-01), Hartemann et al.
patent: 2001/0043667 (2001-11-01), Antonell et al.
patent: 2003/0174741 (2003-09-01), Weingarten et al.
patent: 2003/0202546 (2003-10-01), Hartemann et al.
patent: 0 276 437 (1987-12-01), None
patent: 2300241 (1996-10-01), None
Mitsuru Uesaka, Atsushi Fukasawa, Katsuhiro Dobashi, Hokuto Iijima, Junji Urakawa, Toshiyasu Higo, Mitsuo Akemoto, Hitoshi Hayano; Title: “X-Band RF Gun/Linac for Inverse Compton Scattering Hard X-Ray Source”; Proceedings of Linac 2002, Gyeongju, Korea; pp. 628-630.
Filkins Robert John
Lawrence Brian Lee
Lorraine Peter William
Church Craig E.
Fletcher Yoder
General Electric Company
Suchecki Krystyna
LandOfFree
System and method for X-ray generation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for X-ray generation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for X-ray generation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3552793