System and method for wavelength error measurement

Details System and method for wavelength error measurement System and method for wavelength error measurement

2007-04-10

2007-04-10

Rodriguez, Armando (Department: 2828)

Coherent light generators

Particular beam control device

Optical output stabilization

C372S029011, C372S032000

Reexamination Certificate

active

11215667

ABSTRACT:
A system for detecting wavelength error that includes one or more ordered pairs of photodetectors each of which receives an individual optical signal and is used to detect a wavelength error in that optical signal. Each individual optical signal is directed towards a corresponding pair of photodetectors. The pair of photodetectors are positioned around a region of maximum constructive interference or minimum insertion loss. A feedback circuit analyzes output signals from the photodetectors and determines wavelength error based on differences between the output signals from the photodetectors.

REFERENCES:
patent: 6181717 (2001-01-01), Kner et al.

Affiliated with

Also associated with

Rating

System and method for wavelength error measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for wavelength error measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for wavelength error measurement will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3745796