Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-08-22
2006-08-22
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C182S188000
Reexamination Certificate
active
07096154
ABSTRACT:
A method of displaying the probabilities associated with a Markov model as a series of interactive plots is disclosed. Three dimensions of probability data associated with a Markov model are presented to a user in a concise manner. Heat maps are used to display probability data from a Markov model so that the user can identify and understand hidden patterns and information in the data such as state and emission transitions which are not possible to see with conventional state diagram plots.
REFERENCES:
patent: 6493637 (2002-12-01), Steeg
patent: 2002/0146724 (2002-10-01), Toll et al.
patent: 2004/0176879 (2004-09-01), Menon et al.
Bui Bryan
The Mathworks, Inc.
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