Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate
2011-06-28
2011-06-28
Shah, Kamini S (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
C703S014000, C703S020000, C714S044000, C714S715000, C714S735000, C714S736000, C714S742000, C716S030000, C716S030000
Reexamination Certificate
active
07970594
ABSTRACT:
A mechanism for exploiting the data gathered about a system model during the system design phase to aid the identification of errors subsequently detected in a deployed system based on the system model is disclosed. The present invention utilizes the coverage analysis from the design phase that is originally created to determine whether the system model as designed meets the specified system requirements. Included in the coverage analysis report is the analysis of which sets of test vectors utilized in simulating the system model excited individual components and sections of the system model. The present invention uses the information associated with the test vectors to select appropriate test vectors to use to perform directed testing of the deployed system so as to confirm a suspected fault.
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Cesari and McKenna LLP
Gebresilassie Kibrom
Reinemann Michael R.
Shah Kamini S
The MathWorks, Inc.
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