System and method for using microgyros to measure the...

Geometrical instruments – Indicator of direction of force traversing natural media – Borehole direction or inclination

Reexamination Certificate

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C033S313000, C033S321000, C073S504040

Reexamination Certificate

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11510281

ABSTRACT:
A system and method for determining an orientation of the survey tool within a borehole utilizes a survey tool including a plurality of rotation sensors each having a sensing axis and a direction of least acceleration sensitivity. The plurality of rotation sensors are mounted in a housing with their sensing axes generally parallel to one another and with their directions of least acceleration sensitivity generally non-parallel to one another. The survey tool further includes a controller adapted to calculate a weighted average of the detected angular rotation rates from the plurality of rotation sensors. The weighted average includes the detected angular rotation rate of each rotation sensor about its sensing axis weighted by the detected acceleration along its direction of least acceleration sensitivity.

REFERENCES:
patent: 3143892 (1964-08-01), Chapman
patent: 3741500 (1973-06-01), Liden
patent: 4522062 (1985-06-01), Peters
patent: 4537067 (1985-08-01), Sharp et al.
patent: 4821572 (1989-04-01), Hulsing, II
patent: 4909336 (1990-03-01), Brown et al.
patent: 4987684 (1991-01-01), Andreas et al.
patent: 5099927 (1992-03-01), Gibson et al.
patent: 5432699 (1995-07-01), Hache et al.
patent: 5635638 (1997-06-01), Geen et al.
patent: 5635640 (1997-06-01), Geen et al.
patent: 5657547 (1997-08-01), Uttecht et al.
patent: 5806195 (1998-09-01), Uttecht et al.
patent: 5812068 (1998-09-01), Wisler et al.
patent: 5821414 (1998-10-01), Noy et al.
patent: 5842149 (1998-11-01), Harrell et al.
patent: 5869760 (1999-02-01), Geen
patent: 5912524 (1999-06-01), Ohnishi et al.
patent: 6021377 (2000-02-01), Dubinsky et al.
patent: 6044706 (2000-04-01), Roh
patent: 6089089 (2000-07-01), Hsu
patent: 6122961 (2000-09-01), Geen et al.
patent: 6134961 (2000-10-01), Touge et al.
patent: 6145378 (2000-11-01), MacRobbie et al.
patent: 6173773 (2001-01-01), Almaguer et al.
patent: 6192748 (2001-02-01), Miller
patent: 6206108 (2001-03-01), MacDonald et al.
patent: 6257356 (2001-07-01), Wassell
patent: 6267185 (2001-07-01), Mougel et al.
patent: 6281618 (2001-08-01), Ishitoko et al.
patent: 6315062 (2001-11-01), Alft et al.
patent: 6347282 (2002-02-01), Estes et al.
patent: 6360601 (2002-03-01), Challoner et al.
patent: 6381858 (2002-05-01), Shirasaka
patent: 6453239 (2002-09-01), Shirasaka et al.
patent: 6484818 (2002-11-01), Alft et al.
patent: 6655460 (2003-12-01), Bailey et al.
patent: 6845665 (2005-01-01), Geen
patent: 6848304 (2005-02-01), Geen
patent: 6859751 (2005-02-01), Cardarelli
patent: 6895678 (2005-05-01), Ash et al.
patent: 7117605 (2006-10-01), Ekseth et al.
patent: 2002/0046605 (2002-04-01), Geen et al.
patent: 2002/0056201 (2002-05-01), Dallas et al.
patent: 2002/0112887 (2002-08-01), Harrison
patent: 2005/0183502 (2005-08-01), Rodney
patent: 2005/0224257 (2005-10-01), Ekseth et al.
patent: 2006/0253253 (2006-11-01), Reynolds et al.
patent: 0 646 696 (1994-09-01), None
patent: PCT/US2004/021899 (2004-07-01), None
patent: PCT/US2005/012317 (2005-04-01), None
±150 °/s Single Chip Yaw Rate Gyro with Signal Conditioning, Analog Devices, ADXRS150, © 2003 Analog Devices, Inc.
±300 °/s Single Chip Yaw Rate Gyro with Signal Conditioning, Analog Devices, ADXRS300.
Geen, J., et al.,New iMEMS® Angular-Rate-Sensing Gyroscope, Analog Dialogue, 2003, vol. 37, No. 3, pp. 1-4.
Teegarden, Darrell, et al.,How to Model and Simulate Microgyroscope Systems, IEEE Spectrum, Jul. 1998, vol. 35, No. 7, pp. 66-75.
Yazdi, N., et al.,Micromachined Inertial Sensors, Proc. of the IEEE, Aug. 1998, vol. 86, No. 8, pp. 1640-1659.

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