Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping
Reexamination Certificate
2007-02-06
2007-02-06
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
History logging or time stamping
C702S179000, C702S183000, C702S188000
Reexamination Certificate
active
11215945
ABSTRACT:
The invention provides a system and a method of electronically tracking a history of engineering change orders (ECOs) associated with a manufactured device. The device has at least one electronic component thereon. The method comprises, generally, storing in an electronic storage device associated with the device, the history of ECOs and updating the history of ECOs when a new ECO is associated with the device to indicate whether the new ECO was implemented on the device. The system utilizes the method and has an electronic storage device associated with the device and a data element stored therein. The contents thereof indicate the history of ECOs for the device and allow modification thereto to indicate whether a new ECO was implemented thereon. An ECO history enables a determination to be made of compatibilities between hardware and software elements and between hardware and firmware elements.
REFERENCES:
patent: 5307261 (1994-04-01), Maki et al.
patent: 6295513 (2001-09-01), Thackston
patent: 6651239 (2003-11-01), Nikitin et al.
patent: 6892159 (2005-05-01), Weiss et al.
patent: 6952808 (2005-10-01), Jamieson et al.
patent: 2003/0216881 (2003-11-01), Weiss et al.
patent: 2004/0078634 (2004-04-01), Gilstrap et al.
patent: 0 483 039 (1992-04-01), None
Peng T-K. et al: “A step toward STEP-compatible engineering data management: the date models of product structure and engineering changes”, Robotics and Computer Integrated Manufacturing, Elsevier Science Publishers Bv., Barking, GB., vol. 14, No. 2, Apr. 1998, pp. 89-109.
Hunter, C. S. et al: “CSTAR database for advanced test systems”, Electronic Components And Technology Conference, 1993, Proceedings., 43rd Orlando, FL, USA Jun. 1-4, 1993, New York, NY, USA, IEEE, Jun. 1, 1993, pp. 166-168.
J. Lettieri et al., “Electronic Engineering Change Level Control, Oct. 1980”, IBM Technical Disclosure Bulletin, vol. 23, No. 5, Oct. 1, 1980, p. 2008.
John Swansen Sheldon Keith
MacQueen Kenneth Glenn
Alcatel
Hoff Marc S.
Suarez Felix
Zegeer Jim
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