Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Event-driven
Reexamination Certificate
2006-08-15
2006-08-15
Paladini, Albert W. (Department: 2125)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Event-driven
C327S175000, C327S291000, C713S501000
Reexamination Certificate
active
07092866
ABSTRACT:
A technique for applying time compression to simulate long-term execution of a software application in the short time frames includes providing simulated events to a software application under test and selectively advancing the system clock. The subject system utilizes two utility modules to interact with a software application under testing. The first module, the Event Simulation module, generates a range of predefine events which simulate the nature and frequency of events to which the software application would react. The second module, the Clock Modification module, intercepts the time signal generated by the operating system under which the software application is executing and modifies the clock signal, typically by advancing the time at a rate which is faster than one second per second, i.e., normal time rate. With the subject system, the behavior of an application over a simulated period may be observed in just a fraction of the simulated period duration, e.g. one year of simulated testing performance in five days. For systems or applications where behavior is influenced by the historical pattern of use, the disclosed technique for time compression can identify defects that normally occur only after extended periods of use.
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International Business Machines - Corporation
Kudirka & Jobse LLP
Paladini Albert W.
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