Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1992-10-29
1994-03-15
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
374 5, 165 61, G01N 360
Patent
active
052941990
ABSTRACT:
The invention is an improvement in a thermal stress screening system of the type using a single type of liquid for alternately transferring heat to and from the product. In the improvement, the product is confined in a single chamber during alternate heat transfer. That is, the system provides "one chamber" thermal stress screening. The system includes a plurality of tanks, one each for hot and cold liquid, and a heat exchanger associated with each tank so that the liquid in a tank is maintained at the proper temperature for stress screening. An improved method for thermally stress screening products, e.g., printed circuit boards, includes the steps of placing the product in a chamber, flowing cold liquid into the chamber, draining the cold liquid from the chamber and flowing hot liquid into the same chamber.
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Boersen Harry D.
Eldred John M.
Hayes Robert K.
Jasinski Vince J.
Pattee Kim A.
Bennett G. Bradley
Cuchlinski Jr. William A.
Venturedyne Ltd.
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