Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-03-27
2007-03-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S132000, C713S322000, C713S501000, C374S100000, C323S907000
Reexamination Certificate
active
11050324
ABSTRACT:
A system and method are provided for monitoring temperature within a specified integrated circuit. Usefully, the system comprises at least one oscillator device proximate to the integrated circuit for generating signal pulses at a frequency that varies as a function of the temperature adjacent to the oscillator device. The system further comprises a control unit for establishing sample acquisition periods of invariant time duration based on an time invariant reference clock. A sampling component is coupled to count the number of pulses generated by the oscillator device during each of a succession of the time invariant sample acquisition periods, and a threshold component responsive to the respective count values for the succession of sample acquisition periods provides notice when at least some of the count values have a value associated with a prespecified excessive temperature level.
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U.S. Appl. No. 10/366,437, filed Feb. 13, 2003, Clabes et al., Thermally Aware Integrated Circuit.
Floyd Michael Stephen
Lazarus Asher Shlomo
Monwai Brian Chan
Barlow John
International Business Machines - Corporation
Skarsten James O.
Tyson Thomas E.
Vo Hien
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