Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2008-01-29
2008-01-29
Stultz, Jessica T (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S221000, C351S205000
Reexamination Certificate
active
10916151
ABSTRACT:
Combined equipment for non-contacting determination of axial length (AL), anterior chamber depth (VKT) and corneal curvature (HHK) of the eye, are also important for the selection of the intraocular lens IOL to be implanted, particularly the selection of an intraocular lens (IOL) to be implanted, preferably with fixation of the eye by means of a fixating lamp and/or illumination through light sources grouped eccentrically about the observation axis.
REFERENCES:
patent: 3785723 (1974-01-01), Guyton
patent: 4019813 (1977-04-01), Cornsweet et al.
patent: 4523821 (1985-06-01), Lang et al.
patent: 4582404 (1986-04-01), Hamilton
patent: 4711541 (1987-12-01), Yoshino et al.
patent: 5139022 (1992-08-01), Lempert
patent: 5386258 (1995-01-01), Nagano
patent: 5512965 (1996-04-01), Snook
patent: 5735283 (1998-04-01), Snook
patent: 5757462 (1998-05-01), Nanjo
patent: 5784146 (1998-07-01), Nanjo et al.
patent: 6079831 (2000-06-01), Sarver et al.
patent: 6331062 (2001-12-01), Sinclair
patent: 6404984 (2002-06-01), Parvulescu et al.
Barth Roland
Behrendt Frank
Bergner Roland
Dietzel Burkhard
Doering Axel
Carl Zeiss Meditec AG
Stultz Jessica T
LandOfFree
System and method for the non-contacting measurements of the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for the non-contacting measurements of the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for the non-contacting measurements of the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3944111