System and method for the measurement of the layer thickness...

Details System and method for the measurement of the layer thickness... System and method for the measurement of the layer thickness...

2006-08-15

2006-08-15

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S054000

Reexamination Certificate

active

07092486

ABSTRACT:
System for measuring layer thicknesses of a multi-layer pipe by measuring with a detector array (2) the attenuation of an X-ray transmitted though the pipe. According to the invention the detector array (2) comprises an array of detector elements D1, D2, D3, D4with a collimator for defining the field of radiation in front of each detector element. The collimator has a narrow diaphragm aperture setting the resolution when the position of the pipe walls is to be determined. The defined field of radiation has an extent sufficient to radiate the four detector elements D1, D2, D3, D4in parallel. In a suitable signal processing of the output signals from the detector elements D1, D2, D3, D4, eg by using the method of least squares, the thicknesses of the different layers may be fairly accurately determined.

REFERENCES:
patent: 4457009 (1984-06-01), Botden
patent: 4560877 (1985-12-01), Hoffman
patent: 4574387 (1986-03-01), Gignoux et al.
patent: 4590658 (1986-05-01), Funyu et al.
patent: 4725963 (1988-02-01), Taylor et al.
patent: 4731534 (1988-03-01), Klein et al.
patent: 5414648 (1995-05-01), Morgan et al.
patent: 6304626 (2001-10-01), Adachi et al.
patent: 3327267 (1985-02-01), None
patent: 0216705 (1987-01-01), None
patent: 1072861 (2001-01-01), None
patent: 2146115 (1985-04-01), None
patent: 2290138 (1995-12-01), None

Affiliated with

Also associated with

Rating

System and method for the measurement of the layer thickness... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for the measurement of the layer thickness..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for the measurement of the layer thickness... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3666599