System and method for the measurement of optical distortions

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S124000

Reexamination Certificate

active

10817538

ABSTRACT:
An apparatus measures optical deviations caused by an aircraft canopy. In this apparatus, a light source generates a beam of light. A collimator, optically coupled to the light source, then collimates the beam of light. An optical assembly patterns the collimated beam of light into a patterned array of subaperture beams, which is directed onto an imaging screen. The patterned collimated beam of light produces images, which are electronically imaged and recorded to memory. An undistorted image results when the aircraft canopy is not placed in a path of the patterned collimated beam of light. However, a distorted image results when the aircraft canopy is placed in a path of the patterned collimated beam of light and distorts the patterned collimated beam of light. A processing unit compares the distorted image to the undistorted image to determine the optical distortions caused by the aircraft canopy.

REFERENCES:
patent: 3723010 (1973-03-01), McCrickered et al.
patent: 3912395 (1975-10-01), Voggenthaler
patent: 4299482 (1981-11-01), Task
patent: 4310242 (1982-01-01), Genco et al.
patent: 4461570 (1984-07-01), Task et al.
patent: 4647197 (1987-03-01), Kitaya et al.
patent: H000999 (1991-12-01), Merkel et al.
patent: 5343288 (1994-08-01), Cohen et al.
patent: 5471297 (1995-11-01), Tani
patent: 5621520 (1997-04-01), Hoffman
patent: 5812260 (1998-09-01), Louisnathan
patent: 6208412 (2001-03-01), Ladewski
patent: 7038791 (2006-05-01), Smith

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for the measurement of optical distortions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for the measurement of optical distortions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for the measurement of optical distortions will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3956855

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.