System and method for testing worst case transients in a...

Details System and method for testing worst case transients in a... System and method for testing worst case transients in a...

2007-05-15

2009-12-15

Sterrett, Jeffrey L (Department: 2838)

Electricity: power supply or regulation systems

Output level responsive

Using a three or more terminal semiconductive device as the...

C323S282000

Reexamination Certificate

active

07633277

ABSTRACT:
One embodiment of the present invention sets forth a system and a method for testing the worst-case transients in the output voltage produced by a switching-mode power supply (SMPS). The system includes an SMPS and a dynamic load generator (DLG). The SMPS converts the input voltage into the output voltage by using a top field-effect transistor (FET) and a bottom FET. The worst case transients occur when the load being provided to the SMPS is turned on or off at the same time the top FET is turned off. The DLG is configured to monitor the edge of the gate voltage of the top FET and to turn the load provided to the SMPS on or off when the edge of the gate voltage of the top FET is falling. Consequently, the disclosed system is able to test the worst-case transients in the output voltage produced by the SMPS in a manner that is more reliable than prior art approaches.

REFERENCES:
patent: 5744944 (1998-04-01), Danstrom
patent: 5987615 (1999-11-01), Danstrom
patent: 6509712 (2003-01-01), Landis
patent: 6809504 (2004-10-01), Tang et al.
patent: 7391192 (2008-06-01), Ostrom et al.
patent: 7443148 (2008-10-01), Weng
patent: 2002/0125871 (2002-09-01), Groom et al.
patent: 2002/0125872 (2002-09-01), Groom et al.
patent: 2007/0096703 (2007-05-01), Jain
patent: 2007/0096704 (2007-05-01), Jain et al.
patent: 2009/0195231 (2009-08-01), Noon et al.

Affiliated with

Also associated with

Rating

System and method for testing worst case transients in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for testing worst case transients in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for testing worst case transients in a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4146067