Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-17
2007-04-17
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
11120017
ABSTRACT:
A test system configured to detect discontinuities in packaged devices. A test unit includes a pulse generator and a sampling circuit. The packaged device is coupled to the test unit via a test fixture. The test unit is configured to transmit a pulse to the packaged device through the test fixture, receive a reflected signal from the packaged device through the test fixture in response to the transmitted pulse, and analyze the reflected signal to detect a discontinuity within the packaged device and/or determine the location of a discontinuity within the packaged device. The test system is configured to store a calibration dataset which includes a set of sample values corresponding to a time domain reflectometry (TDR) test of a calibration packaged device. The test unit is configured to compare data corresponding to the reflected signal to stored values of the calibration dataset to detect a discontinuity in the packaged device.
REFERENCES:
patent: 5514965 (1996-05-01), Westwood
patent: 6026145 (2000-02-01), Bauer et al.
patent: 6137293 (2000-10-01), Wu et al.
patent: 6285195 (2001-09-01), Needle
patent: 6324485 (2001-11-01), Ellis
patent: 6500699 (2002-12-01), Birdsley et al.
patent: 6545497 (2003-04-01), Hebert et al.
patent: 6816242 (2004-11-01), Qian et al.
patent: 6867613 (2005-03-01), Bienek
patent: 2002/0135357 (2002-09-01), Maassen et al.
patent: 2003/0208734 (2003-11-01), Coelho et al.
patent: 2005/0168233 (2005-08-01), Roberts et al.
Cousins Gary A.
Papageorgiou Vassilios
Ramirez Amado
Su Michael Zhuoying
Advanced Micro Devices , Inc.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Nghiem Michael
Rankin Rory D.
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