System and method for testing one or more dies on a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S765010, C324S1540PB, C257S048000, C438S018000, C714S736000

Reexamination Certificate

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11386512

ABSTRACT:
A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies. The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more comparators are connected to the dies and the write registers. The comparator generates a result in response to the original data and the read data.

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patent: 6166557 (2000-12-01), Whetsel
patent: 6233184 (2001-05-01), Barth et al.
patent: 2001-221-833 (2001-08-01), None

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