Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-10
2006-10-10
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S1540PB, C714S736000
Reexamination Certificate
active
07119567
ABSTRACT:
A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more comparators are connected to the dies and the write registers. The comparator generates a result in response to the original data and the read data.
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Keeth, Brent et al., “DRAM Circuit Design A Tutorial,” IEE Press Series on Microelectronic Systems, 24 pages.
Dietz James J.
Ma David SuitWai
Ren Bing
Wang Tao
Chan Emily Y
Infineon Technologies North America Corp.
Nguyen Vinh
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