System and method for testing manufactured lots of electronic de

Details System and method for testing manufactured lots of electronic de System and method for testing manufactured lots of electronic de

1990-09-07

1993-08-10

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3102

Patent

active

052352714

ABSTRACT:
An apparatus for testing semiconductor IC chips including a first tester, a second tester, a test program control section, and a distribution control section. The test program control section supplies data representing a plurality of test items, to the first tester. The first tester determines the characteristics of the semiconductor IC chips of each lot, for each test item. The data representing the characteristics of the IC chips, thus determined for each test item, is supplied to the distribution control section. The distribution control section finds the distribution of the characteristics of the IC chips, and determines whether the distribution is within a predetermined range. If the characteristic distribution is within the range, the distribution control section supplies data representative of the number assigned to the test item to the test program control section, and the test program control section, then deletes the test item corresponding from data supplied to the second tester. The data representing the remaining test items is supplied from the test program control section to the second tester. The second tester tests the IC chips for only the undeleted test items.

REFERENCES:
patent: 3084326 (1963-04-01), Mitchell
patent: 3526836 (1970-09-01), Deger et al.
patent: 4242751 (1980-12-01), Henckels et al.
patent: 4768195 (1988-08-01), Stoner et al.
patent: 4985673 (1991-01-01), Horie

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