System and method for testing information-embedded region...

Facsimile and static presentation processing – Static presentation processing – Attribute control

Reexamination Certificate

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C358S003240, C358S001150, C358S001180, C358S504000, C358S406000, C340S005860

Reexamination Certificate

active

07830557

ABSTRACT:
A method for testing a printing system for printing information-embedded regions includes transmitting a test sheet data file to a print service provider. The test sheet data file includes a plurality of complete or incomplete information-embedded regions. A sample printed using the test sheet data file is received from the print service provider. The printed sample is evaluated, and a record of the evaluation is created. The evaluation record is stored.

REFERENCES:
patent: 6674875 (2004-01-01), Phillips et al.
patent: 6689035 (2004-02-01), Gerber
patent: 7359098 (2008-04-01), Suenaga et al.
patent: 2002/0171868 (2002-11-01), Yoshimura et al.
patent: 2002/0191199 (2002-12-01), Imada et al.
patent: 2003/0174357 (2003-09-01), Lester et al.
patent: 2004/0061884 (2004-04-01), Yamaguchi
patent: 2006/0126106 (2006-06-01), Harrington
patent: 2006/0147082 (2006-07-01), Jordan et al.
patent: 2006/0180661 (2006-08-01), Grant et al.
Bacheldor, B., “U.S. Senate Bill Proposes Technology to Authenticate Drugs”, RFID Journal, May 18, 2007, http://www.rfidjournal.com/article/articleprint/3322 ( 2 pgs).
Roberts, R., “The Role of Nanotechnology in Brand Protection,” Packaging Digest, Jan. 2007, pp. 34-40 (reprinted from www.rfidjournal.com).
Kutter, M., “Brand Protection with Micro-Dots,” Jan. 1, 2007, Available at: http:// pffc-online.com/mag/brand-protection-with-micro-dots.

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