Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-08-09
2011-08-09
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762010, C324S762050, C714S703000, C714S733000, C714SE11145
Reexamination Certificate
active
07994806
ABSTRACT:
Embodiments of the present disclosure relate to a system and method for testing an embedded circuit in a semiconductor arrangement as part of an overall circuit that is located on a semiconductor wafer, the system and method comprising an arrangement comprising an overall circuit with at least one input and output. The overall circuit may be provided with an embedded circuit that is not directly connected to the inputs and outputs or may be connected thereto by being specially switched. Switching elements and test islands that are connected thereto may be provided such that the input or the output of the embedded circuit may be connected to the test islands via the switching elements in case of a test. The switching elements may be switched to said test mode in case of a test by applying a voltage to the test island, or the switching elements may be switched in this manner. The arrangement may thus allow for a flexible testing system and method while the used substrate area and the number of required inputs and outputs remain low.
REFERENCES:
patent: 5565801 (1996-10-01), Ernst
patent: 5648730 (1997-07-01), Bhuva et al.
patent: 5724502 (1998-03-01), Cherichetti et al.
patent: 5825194 (1998-10-01), Bhuva et al.
patent: 6068892 (2000-05-01), Ma
patent: 6286115 (2001-09-01), Stubbs
patent: 6720785 (2004-04-01), Bette
patent: 2002/0145440 (2002-10-01), Ohya et al.
patent: 2003/0107391 (2003-06-01), Bard et al.
patent: 2009/0164857 (2009-06-01), Haberla et al.
patent: 44 20 988 (1995-12-01), None
patent: 0632282 (1995-01-01), None
patent: 0 715 178 (1996-06-01), None
patent: 0 786 667 (1997-07-01), None
Bhavsar, Scan Islands—A Scan Partitioning Architecture and its Implementation on the Alpha 21364 Processor, Proceedings of the 20thIEEE VLSI Test Symposium, 2002.
International Search Report mailed May 9, 2006.
JP Abstract of Publication No. 08181181 dated Jul. 12, 1996.
Halberla Holger
Lohbrandt Soeren
Chan Emily Y
Hunton & Williams LLP
Nguyen Ha Tran T
X-FAB Semiconductor Foundries AG
LandOfFree
System and method for testing embedded circuits with test... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for testing embedded circuits with test..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for testing embedded circuits with test... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2698925