System and method for testing devices

Details System and method for testing devices System and method for testing devices

2005-04-05

2005-04-05

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

C324S073100, C714S724000, C702S117000

Reexamination Certificate

active

06876207

ABSTRACT:
A device testing system that has automated test equipment (ATE), which interfaces to a device under test (DUT). The device testing system selects a test set of data including a plurality of test pairs, indicative of DUT parameter values. The system, selects a subset of the plurality of test pairs from the test set of data tests the DUT via the ATE with a portion of the selected subset based upon the test results of at least one of the test pairs.

REFERENCES:
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patent: 6079038 (2000-06-01), Huston et al.
patent: 6370067 (2002-04-01), Ko et al.
patent: 20010035766 (2001-11-01), Nakajima

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