System and method for testing CMOS image sensor

Details System and method for testing CMOS image sensor System and method for testing CMOS image sensor

2007-07-31

2007-07-31

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S116000, C702S122000

Reexamination Certificate

active

11200040

ABSTRACT:
A system and method for testing CMOS image sensors includes a test supporter, a light source controller, an interface card and an image processor. The test supporter supports a CMOS image sensor under test. The light source controller provides a test light to the CMOS image sensor under test. The interface card includes a signal processor and an output port. The signal processor receives a testing data from the CMOS image sensor under test and processes corresponding output data to the output port according to a predetermined output mode. The image processor determines the output mode, and has an input port corresponding to the output port for receiving the output data from the interface card. The image processor determines whether the CMOS image sensor under test is good or not. Therefore, the system can utilize image processors manufactured by various test system manufacturers so as to broaden compatibility.

REFERENCES:
patent: 6326142 (2001-12-01), Royer
patent: 6625558 (2003-09-01), Van Ausdall et al.
patent: 6797933 (2004-09-01), Mendis et al.
patent: 2004/0076325 (2004-04-01), Wada et al.

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