System and method for testing and fault isolation of high densit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324522, G01R 2726

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active

056213271

ABSTRACT:
Apparatus and method are disclosed for performing testing and fault isolation of high density passive boards and substrates. Using a small number of moving probes, simultaneous network resistance and network capacitance measurements may be performed. Thus, test time is minimized by eliminating the need for electrical switching and/or excessive probe movement during the test of a normal circuit board network. Simultaneous network capacitance and network leakage measurement are also achieved using phase-sensitive detection. Dual-frequency measurement techniques allow the measurement of both the capacitance value and resistance value of a leakage path between a network being measured and an unknown network. Any leakage resistance between a network under test and ground or power planes within the circuit board may also be determined from the measurements. Simultaneous independent net-to-plane capacitance characterization is also achieved using signals of mutually independent frequencies accompanied by minimal signal processing. Thus, improved defect detection capabilities are obtained.

REFERENCES:
patent: 3252087 (1966-05-01), Parke
patent: 3320946 (1967-05-01), Dethloff et al.
patent: 3896374 (1975-07-01), Delafon
patent: 3990005 (1976-11-01), Abbe et al.
patent: 4118662 (1978-10-01), Weber
patent: 4146834 (1979-03-01), Maltby et al.
patent: 4342958 (1982-08-01), Russell
patent: 4506210 (1985-03-01), Chase
patent: 4565966 (1986-01-01), Burr et al.
patent: 4975829 (1990-12-01), Clarey et al.
patent: 5055776 (1991-10-01), Miller et al.
patent: 5059897 (1991-10-01), Aton
patent: 5087874 (1992-02-01), Robinson
patent: 5254953 (1993-10-01), Crook et al.
patent: 5266901 (1993-11-01), Woo
patent: 5363048 (1994-11-01), Modlin et al.

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