System and method for testing a phase locked loop in an integrat

Details System and method for testing a phase locked loop in an integrat System and method for testing a phase locked loop in an integrat

1996-03-11

1998-03-17

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324763, G01R 3128

Patent

active

057291519

ABSTRACT:
A method for testing a phase locked loop (103) within an integrated circuit (100) is performed by utilizing an on-chip timer module (100) as a frequency counter (121) for counting the number of clock pulses outputted from the phase locked loop circuit (103) over a selected time period. The test is performed by an external testing device (111) having access to the address/data bus (110) coupled to both the phase locked loop circuit (103) and the timer module (109).

REFERENCES:
patent: 5381085 (1995-01-01), Fischer
patent: 5500627 (1996-03-01), Hulsing, II
patent: 5596280 (1997-01-01), Riggio, Jr.

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