System and method for testing a circuit network having elements

Details System and method for testing a circuit network having elements System and method for testing a circuit network having elements

1993-11-02

1996-03-05

Voeltz, Emanuel T.

Excavating

371 221, 371 2, 364490, H04B 124

Patent

active

054973783

ABSTRACT:
Disclosed is a test method and system for boundary testing a circuit network. The network, made up of individual integrated circuit chips mounted on a printed circuit card or board, has at least one integrated circuit that is testable by IEEE 1149.1 Standard boundary testing, and at least one second integrated circuit that is testable by Level Sensitive Scan Design boundary testing but not by IEEE 1149.1 Standard boundary testing. The test system has a test access port interface with a test access port controller with Test Clock, Test Data In, Test Data Out, Test Mode Select, and Test Reset I/O. The test access port also has an instruction register, a bypass register, a test clock generator, and a Level Sensitive Scan Device boundary scan register.

REFERENCES:
patent: 3892954 (1975-07-01), Neuner
patent: 4057847 (1977-11-01), Lowell et al.
patent: 4195258 (1980-03-01), Yen
patent: 4402055 (1983-08-01), Lloyd et al.
patent: 4485439 (1984-11-01), Rothstein
patent: 4606025 (1986-08-01), Peters et al.
patent: 4899306 (1990-02-01), Greer
patent: 4984239 (1991-01-01), Suzuki et al.
patent: 5157781 (1992-10-01), Harwood et al.
patent: 5185745 (1993-02-01), Manca, Jr.
patent: 5278842 (1994-01-01), Berry, Jr. et al.
patent: 5281864 (1994-01-01), Hahn et al.
patent: 5323400 (1994-06-01), Agarwal et al.
patent: 5325368 (1994-06-01), James et al.
patent: 5329533 (1994-07-01), Liu

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