System and method for testing a characteristic impedance of...

Details System and method for testing a characteristic impedance of... System and method for testing a characteristic impedance of...

2009-10-26

2011-12-20

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

08081008

ABSTRACT:
A method for testing a characteristic impedance of an electronic component includes sending a positioning command to a control computer through a switch, so as to drive a probe holder of a mechanical arm to position probes of a time domain reflectometer (TDR) on a position of the electronic component. The method further receives measured data collected by the TDR, and compares the measured data with preset standard values to determine if the measured data is acceptable.

REFERENCES:
patent: 6891392 (2005-05-01), Nagar et al.
patent: 2007/0074905 (2007-04-01), Lin et al.
patent: 2008/0309354 (2008-12-01), Hsu
patent: 2010/0332169 (2010-12-01), Liang et al.

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