Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Patent
1991-07-10
1992-09-29
Levy, Stuart S.
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
374129, 128664, 364557, G01J 518, A61B 500
Patent
active
051509695
ABSTRACT:
An infrared detector receives infrared energy from the target and provides a detector signal based primarily on the difference between the infrared detector temperature and the temperature of the reference temperature area of the detector. A contact temperature measurement device provides a reference signal which is a function of the temperature of the reference temperature area of the detector. A processor receives the detector and reference signals and combines the two signals in a non-linear manner to result in a signal which is representative of the temperature of the target. The method of non-linearly combining includes the use of gain and offset terms which may be altered to a limited extent by a technician in the field with a blackbody calibration source. As a result of the recalibration, accurate target temperature measurements are continually provided. Additionally, the method of non-linearly combining includes the use of additional gain and offset terms which are adjusted to account for the infrared radiation characteristics of an anatomical target as compared to blackbody calibration source targets. Temperature is determined by combining a polynomial function of the detector with a polynomial function of the reference signal.
REFERENCES:
patent: 2696117 (1950-06-01), Harrison
patent: 4301682 (1981-11-01), Everest
patent: 4433923 (1984-02-01), Rascati et al.
patent: 4456919 (1984-06-01), Tomitol et al.
patent: 4634294 (1987-01-01), Christol et al.
patent: 4722612 (1988-02-01), Junkert et al.
patent: 4734553 (1988-03-01), Noda
patent: 4784149 (1988-11-01), Berman et al.
patent: 4790324 (1988-12-01), O'Hara et al.
patent: 4797840 (1989-01-01), Fraden
patent: 4858615 (1989-08-01), Meinema
patent: 4881823 (1989-11-01), Tanaka et al.
patent: 4900162 (1990-02-01), Beckman et al.
patent: 4986669 (1991-01-01), Yamaguchi
patent: 4993419 (1991-02-01), Pompei et al.
patent: 5012813 (1991-05-01), Pompei et al.
patent: 5015102 (1991-05-01), Yamaguchi
patent: 5017018 (1991-05-01), Iuchi et al.
patent: 5018872 (1991-05-01), Syszynshi et al.
Goldberg Jack
Rosati Robert J.
IVAC Corporation
Levy Stuart S.
Rhoa Joseph A.
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