Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent
1997-06-04
1999-07-20
Kim, Robert
Optics: measuring and testing
Inspection of flaws or impurities
Containers or enclosures
356390, 356370, G01N 2100
Patent
active
059262680
ABSTRACT:
System and method for inspecting a container for defects. A first polarizer positioned between a light source and the container polarizes light provided by the light source for illuminating the container. A second polarizer positioned between the container and a camera polarizes the light transmitted through the container to the camera. As positioned, the axes of transmission of the first and second polarizers are non-parallel relative to each other. An image processor processes an image generated by the camera as a function of an optical characteristic of the image to detect defects in the container.
REFERENCES:
patent: 3328000 (1967-06-01), Rottmann
patent: 3356212 (1967-12-01), Landin
patent: 3716136 (1973-02-01), Birner et al.
patent: 3963348 (1976-06-01), Nakatani et al.
patent: 4021122 (1977-05-01), Krenmayr
patent: 4026656 (1977-05-01), Kusz et al.
patent: 4064534 (1977-12-01), Chen et al.
patent: 4074938 (1978-02-01), Taylor
patent: 4082463 (1978-04-01), Dehait et al.
patent: 4097158 (1978-06-01), Dehait
patent: 4136930 (1979-01-01), Gomm et al.
patent: 4175236 (1979-11-01), Juvinall
patent: 4230266 (1980-10-01), Juvinall
patent: 4283145 (1981-08-01), Miyazawa
patent: 4376951 (1983-03-01), Miyazawa
patent: 4391373 (1983-07-01), Wiggins
patent: 4399357 (1983-08-01), Dorf et al.
patent: 4459487 (1984-07-01), Leser
patent: 4492477 (1985-01-01), Leser
patent: 4509081 (1985-04-01), Peyton et al.
patent: 4644151 (1987-02-01), Juvinall
patent: 4691231 (1987-09-01), Fitzmorris et al.
patent: 4694158 (1987-09-01), Leser
patent: 4731649 (1988-03-01), Chang et al.
patent: 4736851 (1988-04-01), Ricros et al.
patent: 4750035 (1988-06-01), Chang et al.
patent: 4801319 (1989-01-01), Rugaber et al.
patent: 4874940 (1989-10-01), McMeekin et al.
patent: 4906098 (1990-03-01), Thomas et al.
patent: 4914289 (1990-04-01), Nguyen et al.
patent: 4915237 (1990-04-01), Chang et al.
patent: 4945228 (1990-07-01), Juvinall et al.
patent: 5090576 (1992-02-01), Menten
patent: 5095204 (1992-03-01), Novini
patent: 5202932 (1993-04-01), Cambier et al.
patent: 5214713 (1993-05-01), Juvinall
patent: 5243184 (1993-09-01), Fukuchi et al.
patent: 5256871 (1993-10-01), Baldwin
patent: 5258611 (1993-11-01), Leser
patent: 5260780 (1993-11-01), Staudt, III
patent: 5267033 (1993-11-01), Hoshino
patent: 5270535 (1993-12-01), Leser
patent: 5405015 (1995-04-01), Bhatia et al.
patent: 5437702 (1995-08-01), Burns et al.
patent: 5442446 (1995-08-01), Gerber et al.
patent: 5486692 (1996-01-01), Baldwin
patent: 5499718 (1996-03-01), Bhatia et al.
Bonewitz Manuel
Kosta Bozidar
Parniawski Richard
Inex Inc.
Kim Robert
LandOfFree
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